On Thu, Dec 15, 2016 at 03:00:15PM -0700, Terry Raymond wrote: >Please explain vectorize --> Hires https://en.wikipedia.org/wiki/Image_tracing describes the vectorizing of single-layer images. In the silicon die images, one would want to trace the multiple layers that comprise the circuit. Obviously, the input needs to be a suitably high-resolution image, or actually a set of images focusing on the different layers on the surface of the silicon die. http://visual6502.org/images/6502/index.html says that the 6502 die shots were in 4,677×5,097 pixels in size. I guess that the vectorization might become easier when the image resolution with respect to the feature size is larger. https://en.wikipedia.org/wiki/Image_stitching is another technique that I would expect to come into play is because to capture the necessary amount of detail, the microscope can only view a part of the silicon die at a time. So, you would stitch multiple images together. And I guess it is hard to get good shots when you have to move the decapped chip between exposures. Marko Message was sent through the cbm-hackers mailing listReceived on 2016-12-16 07:00:02
Archive generated by hypermail 2.2.0.